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The memory is configured to provide a database, and is operative to store a netlist including nets of an integrated circuit under design.
Cell with fixed output voltage for integrated circuit. The IC further comprises a test arrangement for testing the respective clusters of switches ; in a test mode. Existing ATPG tools may be used without modification by performing scan insertion on a “dummy” circuit and performing ATPG on the scan-augmented dummy circuit.
Laurent Souef, Didier Gayraud. The row drive and the column drive are in a low conductive condition except when a relevant key switch is activated. Laurent Souef has filed for patents to suef the following inventions. The laurnet response of the integrated circuit to the test vector is provided under the control soeuf a second clock signal 56 which is slower than the first clock signal.
The invention relates to a testable integrated circuit. Thus, no power consumption of such stages takes place during functional operation. Frederic Natali, Laurent Souef.
Laurent Souef Inventions, Patents and Patent Applications – Justia Patents Search
In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell 34 which comprises a flipflop kaurent and means 31 able to set the output voltage of the cell when the circuit is in the operation mode.
The test vector bits are passed between adjacent portions of the shift register arrangement timed with the first clock signal 42 and an output response of the integrated circuit to the test vector is provided and analyzed. Furthermore, the method can be implemented without requiring additional complexity of the testing circuitry to be integrated onto the circuit substrate.
The row drive provides a current input for the column drive in one phase of operation and the column drive provides a current input ssouef a row drive in a second laurennt of operation.
Low power scannable counter. Method of discriminating between different types of scan failures, computer readable code to cause a lsurent to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system.
A method of testing an integrated circuit, comprises providing a test vector to a shift register arrangement by providing test vector bits in series into the shift register arrangement 20 timed with a first, scan, clock signal In an integrated circuit incorporating a series of sequential cells SEQ 1 -SEQ laurebt implementing a shift function, clock skew problems are avoided by interconnecting the cells in order starting with the cell SEQ 3 having greatest clock latency and ending with the cell SEQ 7 having smallest clock latency.
The test arrangement comprises a test control input; a test output coupled to the respective internal supply rails and control means, coupled to the test control input for enabling a selected cluster of switches ; in the test mode. souer
In the scan test mode, the counter operates as a shift register and it is fully testable. A computer implemented circuit synthesis system includes a memory, an automatic test pattern generation ATPG algorithm, and processing circuitry.
Method of testing an integrated circuit by simulation. Each of the stages or cells comprises a flip-flop and a multiplexer which together operate as a toggle flip-flop only when all of the previous flip-flops are set.
BibTeX records: Laurent Souef
The result is that the flip-flop clock is forced high preventing any transition of the flip-flop internal clock tree for all stages or cells where the output is low.
These means for setting the output voltage are controlled by a control zouef 15 which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.
Patrick Da Silva, Laurent Souef. Each cluster of switches ; has a first switch having a first size and a second switch having a second size, a fault-free first switch having a higher resistance than a fault-free second switch Computer implemented circuit synthesis system.
Jerome Bombal, Laurent Souef. Pseudo-scan testing using hardware-accessible IC structures.
Clock-skew resistant chain of sequential cells. Koninklijke Philips Electronics N. A method of discriminating between different types of simulated scan failures includes simulating a scan enable signal to a circuit represented by a netlist corresponding to a scan chain coupled to combinatorial logic being tested, simulating initiation of a data capture cycle in the netlist corresponding to the scan chain, the data capture cycle simulating a series of scan flops from the scan chain being simulated together with the combinatorial logic lakrent simulating scanning data out from each suoef in the scan chain and into a test program.
A key handling circuit for a switching matrix having row and column conductors includes bidirectional drives for the row conductors and the column conductors.